 |
| Quantity: | |
|---|---|
Advantages
1.High resolution and good imaging quality.
2.Open type pre-aligned tungsten wire cathode.
3.Chinese and English operation interface, with one-key imaging function.
4.With low vacuum charge reduction function, it can realize observation without spraying gold.
Specifications
Item | DJ-SEM300S | |||
Resolution | 3nm@30kv(SE) 6nm@30kv(BSE) | |||
Magnification | 8X~300,000X | |||
Filament | Schottky field fires electron guns | |||
Accelerating voltage | 0~30kv | |||
Automatic function | Electron gun heating, bias, centering, focusing, brightness, contrast, astigmatism elimination, astigmatism memory, etc., automatic correction, automatic fault detection. | |||
Detector | High vacuum secondary electron detector,Semiconductor quadrant backscatter detector,CCD | |||
Manual stage | Four-axis motor table | Five-axis automatic table | ||
Travel range | X | 0~80mm | 0~70mm | 0~80mm |
Y | 0~60mm | 0~50mm | 0~50mm | |
Z | 0~50mm | 0~45mm | 0~30mm | |
R | 360° | 360° | 360° | |
T | -5°~90° | -5°~90°（Manual） | -5°~70° | |
Maximum sample diameter | 175mm | 175mm | 340mm | |
Maximum sample height | 40mm | 35mm | 20mm | |
Vacuum system | Turbomolecular pump，Mechanical pump | |||
Low vacuum mode | Low vacuum range: 10~270pa continuously adjustable, vacuum degree switching mode: one-key switching, vacuum degree switching time: ≤90 seconds | |||
Optional detector | EBSD/EDS/CL | |||
Optional accessories | EBL\high and low temperature table\nano console\stretching table | |||
Application:
Scanning electron microscope (SEM) is a precision instrument used for high-resolution micro-area analysis. At present, scanning electron microscope has been widely used in life science, physics, chemistry, justice, earth science, Micro research in the fields of materials science and industrial production.
Advantages
1.High resolution and good imaging quality.
2.Open type pre-aligned tungsten wire cathode.
3.Chinese and English operation interface, with one-key imaging function.
4.With low vacuum charge reduction function, it can realize observation without spraying gold.
Specifications
Item | DJ-SEM300S | |||
Resolution | 3nm@30kv(SE) 6nm@30kv(BSE) | |||
Magnification | 8X~300,000X | |||
Filament | Schottky field fires electron guns | |||
Accelerating voltage | 0~30kv | |||
Automatic function | Electron gun heating, bias, centering, focusing, brightness, contrast, astigmatism elimination, astigmatism memory, etc., automatic correction, automatic fault detection. | |||
Detector | High vacuum secondary electron detector,Semiconductor quadrant backscatter detector,CCD | |||
Manual stage | Four-axis motor table | Five-axis automatic table | ||
Travel range | X | 0~80mm | 0~70mm | 0~80mm |
Y | 0~60mm | 0~50mm | 0~50mm | |
Z | 0~50mm | 0~45mm | 0~30mm | |
R | 360° | 360° | 360° | |
T | -5°~90° | -5°~90°（Manual） | -5°~70° | |
Maximum sample diameter | 175mm | 175mm | 340mm | |
Maximum sample height | 40mm | 35mm | 20mm | |
Vacuum system | Turbomolecular pump，Mechanical pump | |||
Low vacuum mode | Low vacuum range: 10~270pa continuously adjustable, vacuum degree switching mode: one-key switching, vacuum degree switching time: ≤90 seconds | |||
Optional detector | EBSD/EDS/CL | |||
Optional accessories | EBL\high and low temperature table\nano console\stretching table | |||
Application:
Scanning electron microscope (SEM) is a precision instrument used for high-resolution micro-area analysis. At present, scanning electron microscope has been widely used in life science, physics, chemistry, justice, earth science, Micro research in the fields of materials science and industrial production.
