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DJ-SEM300 Desktop Tungsten Filament Scanning Electron Microscope

Availability:
Quantity:

Advantages

1.High resolution and good imaging quality.

2.Open type pre-aligned tungsten wire cathode,Optional lanthanum hexaboride filament.

3.Chinese and English operation interface, with one-key imaging function.

4.Low maintenance and repair costs



Specifications

Item

DJ-SEM300

Resolution

3nm@30kv(SE)  6nm@30kv(BSE)

Magnification

8X~300,000X

Filament

Schottky field fires electron guns/Lanthanum hexaboride (optional)

Accelerating voltage

0~30kv

Automatic function

Electron gun heating, bias, centering, focusing, brightness, contrast, astigmatism elimination, astigmatism memory, etc., automatic correction, automatic fault detection.

Detector

High vacuum secondary electron detector,Semiconductor quadrant backscatter detector,CCD

Sample stage

Manual stage

Four-axis motor table

Five-axis automatic table




Travel range

X

0~80mm

0~70mm

0~80mm

Y

0~60mm

0~50mm

0~50mm

Z

0~50mm

0~45mm

0~30mm

R

360°

360°

360°

T

-5°~90°

-5°~90°(Manual)

-5°~70°

Maximum sample diameter

175mm

175mm

340mm

Maximum sample height

40mm

35mm

20mm

Vacuum system

Turbomolecular pump,Mechanical pump

Optional detector

EBSD/EDS/CL

Optional accessories

EBL\high and low temperature table\nano console\stretching table






Application:

Scanning electron microscope (SEM) is a precision instrument used for high-resolution micro-area analysis. At present, scanning electron microscope has been widely used in life science, physics, chemistry, justice, earth science, Micro research in the fields of materials science and industrial production.

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