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Advantages
1.Schottky Schottky field emission electron gun has high brightness, good monochromaticity, small electron beam spot and long life.
2.The electron beam is used to accelerate the lens barrel to ensure excellent imaging performance under low pressure.
3.With high beam stability and low dispersion, it is suitable for long-term accurate analysis, such as CL, EDS, EBSD.
4.Non-conductive samples with low acceleration voltage can be observed directly without gold spraying.
5.Easy to operation.
6.Large sample storage to meet the observation requirements of different customers.
Specifications
Item | DJ-SEM1000 | |
Resolution | 1nm@30kv(SE) 3nm@1kv(SE) 2.5nm@30kv(BSE) | |
Magnification | 6X~1000,000X | |
Electron gun type | Schottky field fires electron guns | |
Accelerating voltage | 0~30kv | |
Automatic function | Focus, brightness/contrast, astigmatism, medium electron beam pair | |
Vacuum system | 1 ion pump, 1 getter ion compound pump, 1 molecular pump and 1 mechanical pump | |
Detector | High vacuum secondary electron detector (with the protection for the detector) | |
Five-axis automatic pre-centering sample stage | ||
Travel range | X | 0~150mm |
Y | 0~150mm | |
Z | 0~60mm | |
R | 360° | |
T | -5°~70° | |
Maximum sample diameter | 340mm | |
Optional detector | BSE/EDS/EBSD/CL | |
Optional accessories | Pre-drawing room\EBL\high and low temperature table\nano console\stretching table\hand control box\trackball | |
Applications:
Scanning electron microscope (SEM) is a precision instrument used for high-resolution micro-area analysis. At present, scanning electron microscope has been widely used in life science, physics, chemistry, justice, earth science, Micro research in the fields of materials science and industrial production.
Advantages
1.Schottky Schottky field emission electron gun has high brightness, good monochromaticity, small electron beam spot and long life.
2.The electron beam is used to accelerate the lens barrel to ensure excellent imaging performance under low pressure.
3.With high beam stability and low dispersion, it is suitable for long-term accurate analysis, such as CL, EDS, EBSD.
4.Non-conductive samples with low acceleration voltage can be observed directly without gold spraying.
5.Easy to operation.
6.Large sample storage to meet the observation requirements of different customers.
Specifications
Item | DJ-SEM1000 | |
Resolution | 1nm@30kv(SE) 3nm@1kv(SE) 2.5nm@30kv(BSE) | |
Magnification | 6X~1000,000X | |
Electron gun type | Schottky field fires electron guns | |
Accelerating voltage | 0~30kv | |
Automatic function | Focus, brightness/contrast, astigmatism, medium electron beam pair | |
Vacuum system | 1 ion pump, 1 getter ion compound pump, 1 molecular pump and 1 mechanical pump | |
Detector | High vacuum secondary electron detector (with the protection for the detector) | |
Five-axis automatic pre-centering sample stage | ||
Travel range | X | 0~150mm |
Y | 0~150mm | |
Z | 0~60mm | |
R | 360° | |
T | -5°~70° | |
Maximum sample diameter | 340mm | |
Optional detector | BSE/EDS/EBSD/CL | |
Optional accessories | Pre-drawing room\EBL\high and low temperature table\nano console\stretching table\hand control box\trackball | |
Applications:
Scanning electron microscope (SEM) is a precision instrument used for high-resolution micro-area analysis. At present, scanning electron microscope has been widely used in life science, physics, chemistry, justice, earth science, Micro research in the fields of materials science and industrial production.
